Collaboration and Information Sharing Results in Improved Failure Analysis Tools, Techniques, and Outcomes

Andrew J. Mawer ;

Andrew J. Mawer

2010 Chairman, ISMI PIFAC

Freescale Semiconductor

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William Ng ;

William Ng

2010 Chairman, ISMI ICFAC

National Semiconductor

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Michael D. Jackson

ISMI Councils Manager, International SEMATECH Manufacturing Initiative

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Abstract

This column addresses the importance of information exchange among failure analysts and explains how it can be accomplished.

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2010

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