Scanning Electron Microscopy
Scanning Electron MicroscopyThis course is a practical introduction to Scanning Electron Microscopy (SEM). SEM is a common and often essential tool in the evaluation and analysis of materials. The course is designed for both beginning and intermediate SEM users and offers a hands-on approach to electron microscopy that includes tips and tricks you can use in your laboratory.
In addition to imaging detectors, SEMs are often equipped with instrumentation for analysis of X-ray signals generated by beam/sample interactions. Energy dispersive spectrometry (EDS) is the most common method to identify and quantify elements present in bulk samples or small (micron-scale) particles and phases. A significant portion of the course is devoted to understanding the origin and interpretation of X-ray data by EDS.
This course is part of our flexible scheduling program.
Contact us via email for a scheduling option that works best for you.
Or call: 440.338.5414
Who Should Attend:
- Technicians
- Researchers
- Quality control specialists
- 米anagers who want to expand their technical knowledge
Required Pre-requisite:
Understanding of high school physics and chemistry
Learning Objectives:
Upon completion of this course, you should be able to:
- Describe what happens to the electrons in the SEM; how they are generated, interact with specimens, and are then detected
- Operate an SEM/EDS instrument (hardware and software) to achieve optimal results
- Perform Energy Dispersive X-ray Spectroscopy (EDS to determine the elemental composition of materials and make the SEM a qualitative and quantitative analytical tool
- Determine when and how to apply specific methods of specimen preparation, viewing and EDS analysis for a variety of conductive and non-conductive materials
- Acquire informative electron images and EDS data that minimize artifacts and emphasize features of interest
Continuing Education Units:3.0
