Automotive electronics are exposed to mechanical shock and vibration, thermal cycling, chemical attack, current and voltage spikes, electromagnetic interference, and other hazards. Early life failures, which are not uncommon, can be difficult to diagnose due to the many contributing factors. This article provides an overview of automotive electronic failures and presents guidelines for determining the root cause.

automotive electronics, early life failures, electromagnetic interference, ESD, inductive coupling
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2018
ASM International
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Semiconductor wafer fabrication Root cause analysis
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