Bringing Closer the Logical and Physical Worlds for Device Analysis: A Case Study

The analysis of scan-based ICs is essentially split between two domains: that of the designer and that of the device analyst. Designers tend to operate within the confines of fault characterization, looking for defects within logic blocks or structures based on test data. Device analysts, on the other hand, are more concerned with physical aspects of the defect such as location, composition, and morphology. These separate worlds are beginning to merge, however, as this case study shows, streamlining the entire failure analysis and resolution process.