The susceptibility of ICs to electromagnetic interference is a growing concern for both designers and failure analysts. This article discusses the causes and effects of transient electromagnetic interference and the factors that influence electromagnetic susceptibility. It explains how to determine susceptibility based on transient pulse testing and presents and interprets the test results of three automotive ICs.

CMOS ICs, failure signatures, transient electromagnetic interference, transient pulse testing
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Copyright © ASM International® 2006
2006
ASM International
Topics
Semiconductor wafer fabrication Automotive electrical systems Electrical testing
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