The Electronic Device Failure Analysis (EDFA) magazine celebrates its 10th anniversary with this issue. This significant milestone provides an opportunity to recall the transition of the Electronic Device Failure Analysis News (EDFAN) newsletter to EDFA magazine. When Chuck Hawkins, then the Editor of EDFAN, proposed converting from a newsletter to a magazine, EDFAS was only a few years into existence, and there was apprehension about such an early transition.

EDFA magazine history
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Copyright © ASM International® 2011
2011
ASM International
Topics
Scanning probe microscopy Semiconductor wafer fabrication
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