This article reviews the basic failure modes of surface-mount tantalum capacitors and the methods used to determine the cause. It discusses the factors that contribute to leakage, shorts, opens, and high series resistance, the characteristics of each failure mode, and the best approaches for failure analysis.

capacitor failures, leakage, nondestructive analysis, tantalum capacitors
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Copyright © ASM International® 2014
2014
ASM International
Topics
Capacitors Semiconductor wafer fabrication Dielectric breakdown Nondestructive testing
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