Four panel members participated in the ISTFA 2014 Panel Discussion on the importance of correctly determining the cause of failure in electronic devices and systems designated for use in space, downhole drilling, and other such applications. Reliability of these components is critical because they cannot be easily replaced and malfunctions can be catastrophic. The panelists presented several methods for analyzing failures in integrated electrical systems and identifying the root cause.

ISTFA, panel discussion
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2015
ASM International
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Semiconductor wafer fabrication Root cause analysis
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