LVI and LVP Applications in In-Line Scan Chain Failure Analysis

This article explains how the success rate of in-line scan chain logic macros can be nearly doubled for certain types of failures with the help of laser voltage imaging and laser voltage probing. The authors provide background information on LVI, LVP, and scan chain logic macros and show how they are used to diagnose skip test, clock-type, and soft single-latch failures.