Materials Characterization (2019 Edition)
Semiconductor Characterization
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Published:2019
Abstract
This article introduces various techniques commonly used in the characterization of semiconductors, namely single-crystal, polycrystalline, amorphous, oxide, organic, and low-dimensional semiconductors and semiconductor devices. The discussion covers material classification, fabrication methods, sample preparation, bulk/elemental characterization methods, microstructural characterization methods, surface characterization methods, and electronic characterization methods.
David T. Schoen, Meredith S. Nevius, Sumit Chaudhary, Semiconductor Characterization, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019, p 11–28, https://doi.org/10.31399/asm.hb.v10.a0006670
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New Handbook: Volume 11B
Volume 11B serves as a reference and guide to help engineers determine the causes of failure in plastic components and make corrective adjustments through design and manufacturing modifications.