Materials Characterization (2019 Edition)
Micro X-Ray Diffraction
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Published:2019
Abstract
This article discusses various concepts of micro x-ray diffraction (XRD) used for the examination of materials in situ. The discussion covers the principles, equipment used, sample preparation procedure, considerations for calibrating a detector, steps for performing data analysis, and applications and interpretation of micro-XRD.
Thomas N. Blanton, Gregory Schmidt, Micro X-Ray Diffraction, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019, p 427–439, https://doi.org/10.31399/asm.hb.v10.a0006656
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